{"id":12116,"date":"2026-10-29T14:18:27","date_gmt":"2026-10-29T05:18:27","guid":{"rendered":"https:\/\/www.first.iir.isct.ac.jp\/?page_id=12116"},"modified":"2026-10-29T18:02:34","modified_gmt":"2026-10-29T09:02:34","slug":"core22","status":"publish","type":"page","link":"https:\/\/www.first.iir.isct.ac.jp\/en\/member\/core22\/","title":{"rendered":"NCKU GICRC-Semiconductor Division"},"content":{"rendered":"<table class=\"tableLayout02\" border=\"1\">\n<tbody>\n<tr>\n<td rowspan=\"5\" align=\"center\" width=\"120\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/cms\/wp-content\/uploads\/ohba_2026.png\" alt=\"ohba_2026.png\" width=\"100\" height=\"133\" \/><\/td>\n<td colspan=\"4\"><strong><a name=\"ohba\"><\/a><span style=\"font-size: 16px;\">Prof. Takayuki OHBA<\/span><\/strong><span style=\"font-size: 12px;\">\uff08Specially Appointed\uff09\uff08Concurrent Post\uff09<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Room<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">S9<\/span><\/td>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Mail-Box<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">S9-11<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>TEL<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">03-5734-2211<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>E-mail<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">takayuki.ohba(at)first.iir.isct.ac.jp\u3000<span style=\"font-size: 8pt;\">Please replace &#8220;(at)&#8221; with &#8220;@&#8221;.<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>HomePage<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\"><a href=\"https:\/\/www.wow.first.iir.isct.ac.jp\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.wow.first.iir.isct.ac.jp\/<\/a><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Research Field<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">BBCube LSI Semiconductor Process Development and Applications<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Objective<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">To develop the cutting-edge BBCube three-dimensional large-scale integration technology and drive the semiconductor industry beyond scaling.<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Current Topics<\/strong><\/span><\/td>\n<td colspan=\"4\">\n<ul>\n<li><span style=\"font-size: 12px;\">Development of mass-production-ready WOW\/COW processes, equipment, and materials.<\/span><\/li>\n<li><span style=\"font-size: 12px;\">BBCube 2.5D\/3D system development.<\/span><\/li>\n<li><span style=\"font-size: 12px;\">BBCube thermal design and heat dissipation technology development.<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Wide-bandgap materials research.<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Social implementation through the WOW Alliance.<\/span><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<table class=\"tableLayout01\" border=\"0\">\n<tbody>\n<tr>\n<td style=\"text-align: center;\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/research_ohba_1.png\" alt=\"research_ohba_1.png\" width=\"269\" height=\"150\" \/><\/td>\n<td style=\"text-align: center;\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/research_ohba_2.png\" alt=\"research_ohba_2.png\" width=\"318\" height=\"150\" \/><\/td>\n<\/tr>\n<tr>\n<td style=\"text-align: center;\" colspan=\"2\"><span style=\"font-size: 10px;\">Bumpless vertical interconnects between wafers<\/span><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table class=\"tableLayout02\" border=\"1\">\n<tbody>\n<tr>\n<td rowspan=\"5\" align=\"center\" width=\"120\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/uploads\/CHEN2019.jpg\" alt=\"CHEN2019.jpg\" width=\"100\" height=\"133\" \/><\/td>\n<td colspan=\"4\"><strong><a name=\"chen\"><\/a><span style=\"font-size: 16px;\">Prof. Kuan-Neng CHEN<\/span><\/strong><span style=\"font-size: 12px;\">\uff08Specially Appointed\uff09\u3014Ito Lab\u3015\uff08Concurrent Post\uff09<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Room<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">J3<\/span><\/td>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Mail-Box<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">J3-132<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>TEL<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">045-924-5866<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>E-mail<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">chien.k.0dea(at)m.isct.ac.jp\u3000<span style=\"font-size: 8pt;\">Please replace &#8220;(at)&#8221; with &#8220;@&#8221;.<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>HomePage<\/strong><\/span><\/td>\n<td colspan=\"3\"><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table class=\"tableLayout02\" border=\"1\">\n<tbody>\n<tr>\n<td rowspan=\"5\" align=\"center\" width=\"120\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/cms\/wp-content\/uploads\/chujo_2025.jpg\" alt=\"chujo_2025.jpg\" width=\"100\" height=\"133\" \/><\/td>\n<td colspan=\"4\"><strong><a name=\"chujo\"><\/a><span style=\"font-size: 16px;\">Prof. Norio CHUJO<\/span><\/strong><span style=\"font-size: 12px;\">\uff08Specially Appointed\uff09\u3014Ito Lab\u3015\uff08Concurrent Post\uff09<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Room<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">R2\u68df<\/span><\/td>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Mail-Box<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">R2-32<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>TEL<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">045-924-5083<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>E-mail<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">chuujou.n.813f(at)m.isct.ac.jp\u3000<span style=\"font-size: 8pt;\">Please replace &#8220;(at)&#8221; with &#8220;@&#8221;.<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>HomePage<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\"><a href=\"https:\/\/www.wow.first.iir.isct.ac.jp\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.wow.first.iir.isct.ac.jp\/<\/a><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Research Field<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">Design and architecture of BBCube 3D integration<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Objective<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">Development of semiconductor technologies that achieve both high performance and low.<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Current Topics<\/strong><\/span><\/td>\n<td colspan=\"4\">\n<ul>\n<li><span style=\"font-size: 12px;\">Research and development of BBCube 3D systems stacking xPUs (e.g., CPUs and GPUs), memory, and voltage regulators<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Development of low-power, high-bandwidth inter-chip communication technologies for 2.5D\/3D integration<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Development of vertically integrated high-efficiency power delivery solutions<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Advanced thermal design and heat dissipation technology development <\/span><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<table class=\"tableLayout01\" border=\"0\">\n<tbody>\n<tr>\n<td style=\"text-align: center;\"><a href=\"https:\/\/www.first.iir.isct.ac.jp\/research_chujo\/\"><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter size-full wp-image-6877\" src=\"https:\/\/www.first.iir.isct.ac.jp\/cms\/wp-content\/uploads\/research_chujo.jpg\" alt=\"\" width=\"500\" height=\"258\" srcset=\"https:\/\/www.first.iir.isct.ac.jp\/cms\/wp-content\/uploads\/research_chujo.jpg 500w, https:\/\/www.first.iir.isct.ac.jp\/cms\/wp-content\/uploads\/research_chujo-300x155.jpg 300w\" sizes=\"auto, (max-width: 500px) 100vw, 500px\" \/><\/a><\/td>\n<\/tr>\n<tr>\n<td style=\"text-align: center;\"><span style=\"font-size: 10px;\">BBCube 3D configuration<\/span><br \/>\n<span style=\"font-size: 10px;\">\u30fbMulti-xPU\/IVR\/Multi-Memory Vertical Stack<\/span><br \/>\n<span style=\"font-size: 10px;\">\u30fbWOW and COW Hybrid Processes<\/span><br \/>\n<span style=\"font-size: 10px;\">\u30fbCu-Damascene Via-Last TSVs)<\/span><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table class=\"tableLayout02\" border=\"1\">\n<tbody>\n<tr>\n<td rowspan=\"5\" align=\"center\" width=\"120\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/yoda_2022.jpg\" alt=\"yoda_2022.jpg\" width=\"100\" height=\"133\" \/><\/td>\n<td colspan=\"4\"><span style=\"font-size: 16px;\"><strong>Prof. Takashi YODA<\/strong><span style=\"font-size: 12px;\">\uff08Specially Appointed\uff09\u3014Ohba Lab\u3015\uff08Concurrent Post\uff09<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Room<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">R2\u68df<\/span><\/td>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Mail-Box<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">R2-32<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>TEL<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">045-924-5083<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>E-mail<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">takashi.yoda(at)first.iir.isct.ac.jp\u3000<span style=\"font-size: 8pt;\">Please replace &#8220;(at)&#8221; with &#8220;@&#8221;.<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>HomePage<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\"><a href=\"https:\/\/www.wow.first.iir.isct.ac.jp\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.wow.first.iir.isct.ac.jp\/<\/a><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Research Field<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">Wide Band Gap (WBG) Semiconductor Technology<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Objective<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">Development of the High performance SiC\/(GaN) devices<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Current Topics<\/strong><\/span><\/td>\n<td colspan=\"4\">\n<ul>\n<li><span style=\"font-size: 12px;\">Defect-Free Engineering<\/span><br \/>\n<span style=\"font-size: 12px;\">\u3000- Lifetime Measurement<\/span><br \/>\n<span style=\"font-size: 12px;\">\u3000- Dislocation Modeling<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Diagnotics Technology<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Advanced Application of WBG Devices<\/span><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<table class=\"tableLayout01\" border=\"0\">\n<tbody>\n<tr>\n<td style=\"text-align: center;\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/research_yoda_1.png\" alt=\"research_yoda_1.png\" width=\"157\" height=\"205\" \/><\/td>\n<td style=\"text-align: center;\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/research_yoda_2.png\" alt=\"research_yoda_2.png\" width=\"435\" height=\"205\" \/><\/td>\n<\/tr>\n<tr>\n<td style=\"text-align: center;\"><span style=\"font-size: 10px;\">Lifetime measurement for n-Buffer SiC layer<\/span><\/td>\n<td style=\"text-align: center;\"><span style=\"font-size: 10px;\">Hyperspectral Raman Imaging of 4H-SiC BPD<\/span><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table class=\"tableLayout02\" border=\"1\">\n<tbody>\n<tr>\n<td rowspan=\"5\" align=\"center\" width=\"120\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/uploads\/yskim2016.jpg\" alt=\"yskim2016.jpg\" width=\"100\" height=\"132\" \/><\/td>\n<td colspan=\"4\"><strong><a name=\"kim\"><span style=\"font-size: 16px;\">Prof. Young Suk KIM<\/span><\/strong><span style=\"font-size: 12px;\">\uff08Visiting\uff09\u3014Ito Lab\u3015\uff08Concurrent Post\uff09<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Room<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">J3<\/span><\/td>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Mail-Box<\/strong><\/span><\/td>\n<td><span style=\"font-size: 12px;\">J3-132<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>TEL<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">045-924-5866<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>E-mail<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\">youngsuk.k.aa(at)m.titech.ac.jp\u3000<span style=\"font-size: 8pt;\">Please replace &#8220;(at)&#8221; with &#8220;@&#8221;.<\/span><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>HomePage<\/strong><\/span><\/td>\n<td colspan=\"3\"><span style=\"font-size: 12px;\"><a href=\"http:\/\/www.wow.pi.titech.ac.jp\/\" target=\"_blank\" rel=\"noopener\">http:\/\/www.wow.pi.titech.ac.jp\/<\/a><\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Research Field<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">Process Integration Development for 3D LSI Devices<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Objective<\/strong><\/span><\/td>\n<td colspan=\"4\"><span style=\"font-size: 12px;\">To develop ultra-thinning of 300-mm device wafers and those stack process integration technology for three-dimensional LSI technology. Because the physical interconnects length becomes 1\/10 using ultra-thin wafers and Wafer-on-Wafer (WOW) process, high performance 3D devices with low power consumption will be realized.<\/span><\/td>\n<\/tr>\n<tr>\n<td style=\"background: #f5f5f5;\"><span style=\"font-size: 12px;\"><strong>Current Topics<\/strong><\/span><\/td>\n<td colspan=\"4\">\n<ul>\n<li><span style=\"font-size: 12px;\">Ultra-thinning 300-mm DRAM wafer down to 2-\u03bcm<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Bumpless vertical interconnects between wafers<\/span><\/li>\n<li><span style=\"font-size: 12px;\">Analyses of defect generation and device characteristics for thinned device wafer<\/span><\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p style=\"text-align: center;\"><img loading=\"lazy\" decoding=\"async\" class=\"mt-image-none\" src=\"https:\/\/www.first.iir.isct.ac.jp\/english\/research_yskim.png\" alt=\"research_yskim.png\" width=\"400\" height=\"175\" \/><br \/>\n<span style=\"font-size: 10px;\">Thinned DRAM 300mm wafer<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Prof. Takayuki OHBA\uff08Specially Appointed\uff09\uff08Concurrent Post\uff09 Room S9 Mail-Box S9-11 TEL 03-5734-2211 E-mail takayuki.ohba(at)first.iir.isct.ac.jp\u3000Please replace &#8220;(at)&#8221; with &#8220;@&#8221;. HomePage https:\/\/www.wow.first.iir.isct.ac.jp\/ Research Field BBCube LSI Semiconductor Process Development and Applications Objective To develop the cutting-edge BBCube three-dimensional large-scale integration technology and drive the semiconductor industry beyond scaling. Current Topics Development of mass-production-ready WOW\/COW processes, equipment, and materials. [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":2011,"menu_order":23,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/www.first.iir.isct.ac.jp\/?page_id=12114","footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-12116","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/pages\/12116","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/comments?post=12116"}],"version-history":[{"count":3,"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/pages\/12116\/revisions"}],"predecessor-version":[{"id":12148,"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/pages\/12116\/revisions\/12148"}],"up":[{"embeddable":true,"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/pages\/2011"}],"wp:attachment":[{"href":"https:\/\/www.first.iir.isct.ac.jp\/wp-json\/wp\/v2\/media?parent=12116"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}